Search results for "National Synchrotron Light Source"
showing 2 items of 2 documents
The effects of precipitates on CdZnTe device performance
2005
A high-intensity X-ray beam collimated down to a 10-micrometer spot size, available at Brookhaven's National Synchrotron Light Source (NSLS), was employed to perform X-ray mapping to measure the correlation between microscopic defects (precipitates) and variations in the collected charges in long-drift CdZnTe (CZT) detectors. First, we use X-ray diffraction topography (XDT) measurements at the high-energy beamline and IR microscopy to identify the defects distribution and strains in the bulk of CZT crystals. Then, we perform X-ray raster scans of the CZT detectors to measure their responses with 10-micrometer spatial resolution. The brightness of the source allows for good statistics in ver…
New results from testing of coplanar-grid CdZnTe detectors
2005
New results from studies of coplanar-grid CdZnTe (CZT) detectors are presented. The coplanar-grid detectors were investigated by using a highly collimated X-ray beam available at Brookhaven's National Synchrotron Light Source and by applying a pulse-shape analysis. The coplanar-grid detector operates as a single-carrier device. Despite the fact that its operational principle is well known and has been investigated by many groups in the past, we found some new details that may explain the performance limits of these types of devices. The experimental results have been confirmed by extensive computer modeling.